April 9, 2024
The statistics of electron transport in a tunnel junction is affected by fluctuations of its voltage bias, which modulates the probability for electrons to cross the junction. We exploit this phenomenon to provide a direct measurement of quantum vacuum fluctuations in the microwave domain of a resistor placed at ultra-low temperature: we show that the amplified vacuum fluctuations are correlated with the noise generated by the junction to contribute to a third moment of detec...
September 26, 2000
Shot noise is not normally evident in bulk solid-state conductors, since it is strongly attenuated by inelastic collisions. The ``anomalous'' emergence of macroscopic shot noise is discussed in G. Gomila and L. Reggiani, Phys. Rev. B 62, 8068 (2000). We remark on the consistency of this linear diffusive model at the large voltages and currents needed to see the effect.
February 23, 1999
The current noise in a multi-probe mesoscopic conductor can have a nonlinear dependence on the strength of driving bias voltage. This paper presents a theoretical formulation for the nonlinear noise spectra. We pay special attention to maintain gauge invariance at the nonlinear level. At small but finite voltages, explicit expressions for nonlinear noise spectra, expanded order by order in the bias, have been derived. In the wideband limit, a closed form solution of the noise...
October 27, 2000
The shot noise in long diffusive SNS contacts is calculated using the semiclassical approach. At low frequencies and for purely elastic scattering, the voltage dependence of the noise is of the form S_I = (4\Delta + 2eV)/3R. The electron-electron scattering suppresses the noise at small voltages resulting in vanishing noise yet infinite dS_I/dV at V = 0. The distribution function of electrons consists of a series of steps, and the frequency dependence of noise exhibits peculi...
July 2, 1999
We investigate current fluctuations in non-degenerate semiconductors, on length scales intermediate between the elastic and inelastic mean free paths. The shot-noise power P is suppressed below the Poisson value P_{\rm Poisson}=2e\bar I (at mean current \bar I) by the Coulomb repulsion of the carriers. We consider a power-law dependence of the elastic scattering time \tau\propto\epsilon^{\alpha} on kinetic energy \epsilon and present an exact solution of the non-linear kineti...
August 4, 1998
We report low-temperature shot noise measurements of short diffusive Au wires attached to electron reservoirs of varying sizes. The measured noise suppression factor compared to the classical noise value $2e\left| I\right| $ strongly depends on the electric heat conductance of the reservoirs. For small reservoirs injection of hot electrons increases the measured noise and hence the suppression factor. The universal 1/3-suppression factor can only asymptotically be reached for...
January 29, 1999
We investigate current fluctuations in non-degenerate semiconductors, on length scales intermediate between the elastic and inelastic mean free paths. We present an exact solution of the non-linear kinetic equations in the regime of space-charge limited conduction, without resorting to the drift approximation of previous work. By including the effects of a finite voltage and carrier density in the contact region, a quantitative agreement is obtained with Monte Carlo simulatio...
June 12, 1999
A general formula for current noise in a two-terminal ballistic nondegenerate conductor under the action of long-range Coulomb correlations has been derived. The noise reduction factor (in respect to the uncorrelated value) is obtained for biases ranging from thermal to shot noise limits, and it is related to spatial variations in transport characteristics. The contributions of different energy groups of carriers to the noise are found, that leads us to suggest an electron en...
August 7, 2008
The fluctuation in electric current in nonequilibrium steady states is investigated by molecular dynamics simulation of macroscopically uniform conductors. At low frequencies, appropriate decomposition of the spectral intensity of current into thermal and excess fluctuations provides a simple picture of excess fluctuations behaving as shot noise. This indicates that the fluctuation-dissipation relation may be violated in a universal manner by the appearance of shot noise for ...
June 30, 1998
Using the 'drift-diffusion-Langevin' equation we show that, at least in one geometry, finite-frequency shot noise is of the order of the 'full' shot noise $2eI$ provided the sample is either short or long enough, $L > L_0(\omega)$. Here $L_0(\omega) = D'/\lph \omega$ with $D'$ the effective diffusion coefficient, $\lph$ the electron-phonon energy relaxation length with energy transfer $eV$, and $\omega$ the observation frequency. For example, in a typical 'zero frequency' exp...