ID: cond-mat/9905159

Influence of resonant tunneling on the imaging of atomic defects on InAs(110) surfaces by low-temperature scanning tunneling microscopy

May 12, 1999

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A. University of Leuven Depuydt, Haesendonck C. University of Leuven Van, N. S. Moscow State University Maslova, V. I. Moscow State University Panov, V. V. Moscow State University Rakov, S. V. Moscow State University Savinov
Condensed Matter
Materials Science

We have used a low-temperature scanning tunneling microscope (STM) to study the surface of heavily doped semiconductor InAs crystals. The crystals are cleaved in situ along the (110) plane. Apart from atomically flat areas, we also observe two major types of atomic scale defects which can be identified as S dopant atoms and as As vacancies, respectively. The strong bias voltage dependence of the STM image of the impurities can be explained in terms of resonant tunneling through localized states which are present near the impurity.

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