June 17, 1999
We report an improved precision measurement of the Casimir force. The force is measured between a large Al coated sphere and flat plate using an Atomic Force Microscope. The primary experimental improvements include the use of smoother metal coatings, reduced noise, lower systematic errors and independent measurement of surface separations. Also the complete dielectric spectrum of the metal is used in the theory. The average statistical precision remains at the same 1% of the forces measured at the closest separation.
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May 22, 2000
We report an improved precision measurement of the Casimir force using metallic gold surfaces. The force is measured between a large gold coated sphere and flat plate using an Atomic Force Microscope. The use of gold surfaces removes some theoretical uncertainties in the interpretation of the measurement. The forces are also measured at smaller surface separations. The complete dielectric spectrum of the metal is used in the comparison of theory to the experiment. The average...
May 29, 1998
We have used an atomic force microscope to make precision measurements of the Casimir force between a metallized sphere of diameter 196 microns and flat plate. The force was measured for plate-sphere separations from 0.1 to 0.9 microns. The experimental results are consistent with present theoretical calculations including the finite conductivity, roughness, and temperature corrections. The root mean square average deviation of 1.6 pN between theory and experiment corresponds...
May 1, 2005
The measurement of the Casimir force between a large gold coated sphere and single crystal silicon plate is performed with an atomic force microscope. A rigorous statistical comparison of data with theory is done, without use of the concept of root-mean-square deviation, and excellent agreement is obtained. The Casimir force between metal and semiconductor is demonstrated to be significantly different than between two similar or dissimilar metals.
January 6, 2000
An upper limit on the Casimir force is found using the dielectric functions of perfect crystalline materials which depend only on well defined material constants. The force measured with the atomic force microscope is larger than this limit at small separations between bodies and the discrepancy is significant. The simplest modification of the experiment is proposed allowing to make its results more reliable and answer the question if the discrepancy has any relation with the...
March 13, 2006
The experimental investigation of the Casimir force between a large metallized sphere and semiconductor plate is performed using an atomic force microscope. Improved calibration and measurement procedures permitted reduction in the role of different uncertainties. Rigorous statistical procedures are applied for the analysis of random, systematic and total experimental errors at 95% confidence. The theoretical Casimir force is computed for semiconductor plates with different c...
June 10, 1999
We consider detailed roughness and conductivity corrections to the Casimir force in the recent Casimir force measurement employing an Atomic Force Microscope. The roughness of the test bodies-a metal plate and a sphere- was investigated with the Atomic Force Microscope and the Scanning Electron Microscope respectively. It consists of separate crystals of different heights and a stochastic background. The amplitude of roughness relative to the zero roughness level was determin...
December 4, 2003
This article is divided in three sections. In the first section we briefly review some high precision experiments on the Casimir force, underlying an important aspect of the analysis of the data. In the second section we discuss our recent results in the measurement of the Casimir force using non-trivial materials. In the third section we present some original ideas for experiments on new phenomena related to the Casimir effects.
December 12, 2007
The influence of random surface roughness of Au films on the Casimir force is explored with atomic force microscopy in the plate-sphere geometry. The experimental results are compared to theoretical predictions for separations ranging between 20 and 200 nm. The optical response and roughness of the Au films were measured and used as input in theoretical predictions. It is found that at separations below 100 nm, the roughness effect is manifested through a strong deviation fro...
June 20, 2003
The first precise measurement of the Casimir force between dissimilar metals is reported. The attractive force, between a Cu layer evaporated on a microelectromechanical torsional oscillator, and an Au layer deposited on an Al$_2$O$_3$ sphere, was measured dynamically with a noise level of 6 fN/$\sqrt{\rm{Hz}}$. Measurements were performed for separations in the 0.2-2 $\mu$m range. The results agree to better than 1% in the 0.2-0.5 $\mu$m range with a theoretical model that t...
February 26, 2008
Experimental methods and procedures required for precision measurements of the Casimir force are presented. In particular, the best practices for obtaining stable cantilevers, calibration of the cantilever, correction of thermal and mechanical drift, measuring the contact separation, sphere radius and the roughness are discussed.